Super-resolution microscopy is a series of techniques in optical microscopy that allow such images to have resolutions higher than those imposed by the diffraction limit,[1][2] which is due to the diffraction of light.[3] Super-resolution imaging techniques rely on the near-field (photon-tunneling microscopy[4] as well as those that use the Pendry Superlens and near field scanning optical microscopy) or on the far-field. Among techniques that rely on the latter are those that improve the resolution only modestly (up to about a factor of two) beyond the diffraction-limit, such as confocal microscopy with closed pinhole or aided by computational methods such as deconvolution[5] or detector-based pixel reassignment (e.g. re-scan microscopy,[6] pixel reassignment[7]), the 4Pi microscope, and structured-illumination microscopy technologies such as SIM[8][9] and SMI.
There are two major groups of methods for super-resolution microscopy in the far-field that can improve the resolution by a much larger factor:[10]
Deterministic super-resolution: the most commonly used emitters in biological microscopy, fluorophores, show a nonlinear response to excitation, which can be exploited to enhance resolution. Such methods include STED, GSD, RESOLFT and SSIM.
Stochastic super-resolution: the chemical complexity of many molecular light sources gives them a complex temporal behavior, which can be used to make several nearby fluorophores emit light at separate times and thereby become resolvable in time. These methods include super-resolution optical fluctuation imaging (SOFI) and all single-molecule localization methods (SMLM), such as SPDM, SPDMphymod, PALM, FPALM, STORM, and dSTORM.
^U.S. Pat. No. 5,666,197: Apparatus and methods employing phase control and analysis of evanescent illumination for imaging and metrology of subwavelength lateral surface topography; John M. Guerra, September 1997. Assigned to Polaroid Corp.
^SPIE (March 2015). "W.E. Moerner plenary presentation: Single-molecule spectroscopy, imaging, and photocontrol -- foundations for super-resolution microscopy". SPIE Newsroom. doi:10.1117/2.3201503.17.